• Book cover of: CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155. By: Alexander A. Demkov

CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155

Alexander A. Demkov

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Leidimo metai 2014 m.
Puslapių skč. 194 psl.
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ISBN 9781107408326

CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Book cover of: CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155. By: Alexander A. Demkov

CMOS Gate-Stack Scaling — Materials, ...

137,00 zł
137,00 zł 141,00 zł