• Book cover of: Fundamentals Of Atomic Force Microscopy - Part I: Foundations. By: Ronald G. Reifenberger

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Ronald G. Reifenberger

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Leidimo metai 2015 m.
Puslapių skč. 340 psl.
Viršelis Kietas viršelis
ISBN 9789814630344

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

Book cover of: Fundamentals Of Atomic Force Microscopy - Part I: Foundations. By: Ronald G. Reifenberger

Fundamentals Of Atomic Force Microsco...

501,00 zł
501,00 zł 516,00 zł