• Book cover of: High Resolution X-Ray Diffractometry And Topography. By: D. Keith Bowen

High Resolution X-Ray Diffractometry And Topography

D. Keith Bowen

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Autorius D. Keith Bowen
Leidimo metai 2019 m.
Puslapių skč. 264 psl.
Viršelis Minkštas viršelis
ISBN 9780367400637

High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography by D. Keith Bowen, Brian K. Tanner.

Published by Taylor & Francis Group, (2019), Paperback, 264 pages.

Topics: X-ray crystallography, X-rays, diffraction, Crystals.

Book cover of: High Resolution X-Ray Diffractometry And Topography. By: D. Keith Bowen

High Resolution X-Ray Diffractometry ...

368,00 zł
368,00 zł 379,00 zł