Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by Krishnendu Chakrabarty, Sandeep K. Goel.

Published by Taylor & Francis Group, (2017), Paperback, 264 pages.

Topics: Metal oxide semiconductors, complementary, Nanotechnology, Complementary Metal oxide semiconductors.